Facilities

The AgilentTM Nano IndenterTM G200
The AgilentTM Nano IndenterTM G200

AgilentTM Nano IndenterTM G200

AgilentTM Nano IndenterTM G200 (over $200,000) with continuous stiffness measurement (CSM) module, dynamic contact module II (DCM II), temperature-control module, and NanoVisionTM scanning probe microscope module. Agilent Technologies is the world top manufacture of nanomechanical testing instruments, and Nano Indenter G200 is their most advanced platform for exploring material properties at the nano and micro scales with ultrahigh resolution: 10 nano-Newton for load and 0.1nm for displacement, and at a temperature up to 350°C.

Through the CSM module, we can characterize materials at the multiscales from 5 nm to 0.5 mm (over 5 orders of magnitude) within minutes. The DCM II extends the range of load-displacement experimentation down to 3nN with the lowest noise floor of any instrument of its type. Through the NanoVision module, the nanoindenter can create nanoscale quantitative high-resolution scanning topographical images, which is critical to test nanomaterials. Through the temperature-control module, the nanoindenter can characterize materials at various temperatures up to 350°C. 

The AgilentTM 5500 AFM
The AgilentTM 5500 AFM

AgilentTM 5500 Atomic Force Microscope (AFM)

Prof. Feng’s group shares a state-of-the-art AgilentTM 5500 Atomic Force Microscope (over $100,000), which can test force as small as 1 pico-Newton (1/1000 of a nano-Newton). The Agilent 5500 is the ideal multiple user research system for atomic force microscopy (AFM) and scanning probe microscopy (SPM). As the high-performance flagship of Agilent’s product line, the 5500 provides a wealth of unique technological features, including patented top-down scanning, ultra-precision temperature control, and industry-leading environmental control.

The Hitachi S-4800 SEM
The Hitachi S-4800 SEM

Hitachi S-4800 Field-Emission Scanning Electron Microscope (SEM)

Prof. Feng’s group shares a state-of-the-art Hitachi S-4800 Field-Emission Scanning Electron Microscope (over $500,000) which is a key nanotechnology instrument for visualizing and characterizing the chemical properties of nano-/bio-materials. The S-4800 SEM is fully integrated with Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscattered Diffraction Pattern (EBDP) systems, which is ideal for ultra-high resolution applications such as semiconductor, materials studies and nanotechnology.